Used PHILIPS / FEI Titan X-Twin 80-300 #9119022 for sale

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ID: 9119022
Wafer Size: 12"
Scanning transmission electron microscope, (TEM), 12" 300 kV FEG Modular column design (3) Condenser lens system Gatan imaging filter Vibration damping platform External scan switch TEM Scripting software Burker Quantax 400 EDA system Haskris chiller Field cancelling system Gatan Ultrascan 2K camera Dark field STEM (DF) Fischione high angle annular dark field (HAADF) Bright field / dark field detector (BF/DF) Gatan Quantum GIF 965 energy filter Dual EELS mode STEM-EELS-EDS TEM/STEM 3D Tomography 2007 vintage.
PHILIPS / FEI Titan X-Twin 80-300 is one of the world's most powerful scanning electron microscopes (SEMs). It features two independent electron optics and two independent diffraction systems, making it an invaluable tool for laboratory analysis. FEI Titan X-Twin 80-300 has a fully-automated operation, allowing the user to quickly acquire the desired images and data. This microscope is capable of working at a variety of magnifications, from sub-nanometer to hundreds of millimeters, and optically integrating generated images for use with 3D analysis programs. It also contains a 15-pole C2 condenser which helps to improve image contrast and superior sample illumination. In terms of hardware, PHILIPS Titan X-Twin 80-300 employs an integrated, heated stage, adapted for EBSD (electron backscatter diffraction) and EDS (energy-dispersive X-ray spectroscopy), allowing for qualitative and quantitative analyses. It also incorporates a useful MMCapsule (Metal Membrane Capsule) electronics chamber which helps to protect delicate parts from electrostatic damage while in operation. The stage is connected to the electronics control and data acquisition station by a protected cable. To ensure a high-quality image capture, Titan X-Twin 80-300 features a variable-aperture level detector, an accuracy of 0.5 nanometer, a well-defined focus of up to 500 nanometers (with an empirical resolution of 1 nanometer), and a dynamic range of 0.3-1000V. PHILIPS / FEI Titan X-Twin 80-300 also provides a wide range of different imaging modes, such as observation, projection, backscatter, and diffraction imaging. Additionally, the microscope helps to reduce sample handling and image processing times with a variety of user-friendly tools, including image and spectra extraction, automated mapping, and automatic drift, tilt, and stig observations. Overall, FEI Titan X-Twin 80-300 is a powerful and versatile scanning electron microscope designed for reliable and accurate operation in a wide range of laboratory settings. Its combination of features, from excellent imaging capture and data extraction to advanced control and sample analysis, makes it an excellent asset for a modern scientific laboratory.
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