Used PHILIPS / FEI Titan #9315607 for sale

Name: PHILIPS / FEI Titan
Brand: PHILIPS / FEI
SKU: 9315607
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Scanning Electron Microscopes

Manufacturer

PHILIPS / FEI

Model

Titan

ID: 9315607

System Electron sources: FEG Acceleration voltage range: 80 kV to 300 kV With preset alignment for 80 kV and 300 kV Scanning transmission electron microscopy mode Convergent beam and selected area electron diffraction modes Conventional TEM modes Point resolution in TEM mode: 0.20 nm at 300 kV Information limit: <0.1 nm STEM Resolution: 0.136 nm at 300 kV Super-twin objective lens pole piece FISCHIONE High angle annular dark field STEM detector for Z-contrast imaging BF and DF STEM detector GATAN Tridiem energy filter: Electron energy loss spectroscopy Energy-filtered TEM Filter energy spread: 0.8 eV Entrance aperture 5 mm EFTEM field of view: 20 μm (diagonal, select TEM models) Maximum diffraction angle: 120 mRad (select TEM models) Non-isochromaticity: < 1.25 eV Distortion: < 1.75 % Chromaticity: < 1.5 μm/eV Detector resolution: 2048 x 2048 pixels (UltraScan™ sensor with HCR™ technology) EFTEM readout speed: 4 frames/sec (EFTEM, 512 x 512) Viewing readout speed: > 10 frames/sec (Cinema mode, 512 x 256) Spectroscopy Filter energy resolution: 0.25 eV Attainable system resolution: 0.6 eV (0.55 eV TEM with cold FEG, 0.25 eV GIF) Detector channels per readout: 2,048 Detector dynamic range: 0 - 60,000 counts/ch Detector noise: < 6 counts/ch Maximum readout speed: > 30 spectra/sec 2K x 2K UltraScan camera No probe / Objective corrector EDX Ultimo max TLE silicon drift detector (100 mm²): Fast mapping: 200,000 Counts per second Energy peak resolution: Separate carbon Nitrogen Oxygen peaks with 50 eV FWHM.

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PHILIPS / FEI Titan is a world-renowned scanning electron microscope (SEM) that excels in both field emission and temperature-controlled scanning electron spectroscopy. With its advanced performance and multiple modes, FEI Titan is an ideal choice for imaging and analyzing a wide range of materials within fields such as microelectronics, metallography, and life sciences. PHILIPS Titan's design features two gun modes: a field emission gun (FEG) with built-in memory, and a titanium-sputtered thermally-controlled field emission gun (TCFEG). Both of these gun modes can be combined to create special imaging modes. The FEG features an integrated e-beam intensity and brightness control equipment, allowing users to adjust the e-beam intensity and voltage for optimal contrast. Titan also provides the capability to operate in a dual-beam mode, which enables probing two types of specimens simultaneously. It includes software packages such as AutoFocus, Auto Comparison, and FEI 3D Scan Interface (PSI). PHILIPS / FEI Titan is equipped with a precise scanning system that allows adjustable step-and-settle scanning across a range of 1 nm to 500 μm. This unit eliminates the need for coarse scans, so users are able to scan quickly and accurately with brief pauses in between steps. It also allows users to observe the specimen at different magnifications during scanning. FEI Titan offers a column length of 200 mm for further imaging depth. PHILIPS Titan is designed to provide excellent resolution with high image quality and flexibility. Its detector machine includes several options for photometric, electric, and magnetic modes. It also includes a specially designed sample holder for quantitative analysis purposes. In addition to its technical features, Titan provides an intuitive user interface with various innovative features such as preset analysis solution, specimen mapping, remote job control, and extended image manipulation. This SEM is designed to meet today's highest requirements, providing superior images and performance. PHILIPS / FEI Titan is a powerful piece of technology for any imaging and analysis applications.