Used PHILIPS / FEI XL 20 #9222939 for sale
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ID: 9222939
Vintage: 1992
Scanning Electron Microscope (SEM), parts system
OXFORD INCAx-act X-Ray disperse energy analyzer
Resolution: 100,000x
Spare parts included
Non-functional PC
1992 vintage.
PHILIPS / FEI XL 20 scanning electron microscope is an advanced analyzer that provides detailed imaging of surfaces and microstructures, allowing for superior imaging performance and improved resolution. The microscope has a powerful 60 kV electron source and offers excellent detection sensibility through its advanced CCD camera. FEI XL 20 offers easy sample positioning with its easy access specimen chamber and low-cost automation. It features high resolution optical imaging capability of up to 50,000 x magnification, allowing for accurate image capture down to the smallest of structural details. With its high performance imaging and automated sample handling, PHILIPS XL20 provides researchers difficult-to-achieve results. PHILIPS / FEI XL20 comprises of a four-segment electron column, including an achromatic objective lens, a back-focusing adjustable electron scan lens, and a secondary electron detector. The four-segment column allows for greater flexibility and higher scanning rates for faster imaging times. FEI XL20 is an integrated system incorporating the use of quadrupole focusing optics for superior contrast and crispness of images. In addition, PHILIPS XL 20 contains a built-in signal processor for advanced image analysis and automated operating functions. The signal processor package offers features such as particle image correlation, spectral analysis, automated image stitching, automated image crop-and-extract, and other automated tools for powerful image analysis and manipulation. The ability to process high-resolution images and deliver high-quality results quickly and accurately makes XL20 a powerful and reliable imaging system. XL 20 is an extremely versatile and powerful dual-frame scanning electron microscope. With its excellent imaging capability, automated features, high speed scanning, and robust processing features, PHILIPS / FEI XL 20 is an ideal choice for advanced nanostructure imaging and metrology applications. Its ease of use and low cost of ownership make it the perfect choice for laboratory or research applications.
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