Used PHILIPS / FEI XL 20 #9243138 for sale

PHILIPS / FEI XL 20 is a scanning electron microscope (SEM) that was designed for imaging and analysis of material surfaces, particle and trace analytics, morphology and elemental analysis. It has a field emission gun (FEG) which improves the performance and accuracy of its electron beams, making it well suited for industrial and material characterization applications. The equipment is equipped with an in-lens secondary electron detector (SED) which allows for detailed topographic imaging. It is also equipped with a backscattered electron detector (BSD) and a filament simulator for superior precision in imaging. The system is optimized for low-vacuum operation, providing access to a wide range of sample types and enabling high-resolution analysis. FEI XL 20 can achieve a resolution of up to 2 nm in the x-y directions and 4 nm in the z direction. It utilizes a 205 mm accelerating voltage, meaning that it can operate in both low and high-energy modes, making it suitable for sampling a variety of materials. The unit also has an in-lens SE detector which provides for high sensitivity imaging/analysis of a range of sample types and for a wide range of operating voltages. Finally, the machine has flexible vacuum operation, enabling samples to be analyzed in ultra-high vacuum (UHV) or low-vacuum environments. This provides for a range of experimental options, from detailed microscopy and surface metrology to particle analysis and spectroscopy. In summary, PHILIPS XL20 is a versatile scanning electron microscope that is ideal for applications such as high-resolution imaging, particle and trace analysis, and elemental characterization. With its flexible vacuum operation and impressive range of detectors and analytical options, it is an excellent choice for a wide range of industrial and research applications.