Used PHILIPS / FEI XL 20 #9260733 for sale

PHILIPS / FEI XL 20 is a scanning electron microscope (SEM) designed for a wide range of applications. It has a maximum resolution of 0.3nm in the SE mode, and an impressive depth of field of up to 8,000 microns. FEI XL 20 has a field emission source which enables low-voltage imaging up to 30kV, allowing for the visualization of softer and more sensitive samples. PHILIPS XL20 incorporates an innovative 1000x1000 pixel Everhart-Thornley secondary electron detector which is capable of producing high contrast images and allowing for in-depth elemental analysis. The sample loading of XL20 is automated for rapid sample mounting and exchange. It has a wide variety of sample holders, including small particles, bumps, and longer structures. XL 20 is a versatile, high-end instrument. It can be configured to run a variety of experiments, for applications ranging from materials characterization and failure analysis, to microanalysis and nanoscale imaging. Its low thermal expansion vacuum chamber and its Zeiss UIS ME general purpose STEM lens provide superior imaging capabilities. It also has a unique automated interface, which can be used to switch between SEM and TEM modes on the fly, with minimal adjustments. Further, its high current emitter allows for higher-powered studies, with varying currents available for operation. The SEM can also be programmed to conduct multi-mode and extended imaging protocols. In addition, PHILIPS XL 20 is equipped with a digital image processor that provides superior live imaging capabilities, allowing users to quickly zoom in and out of the sample, adjust contrast and brightness levels, and even replay recorded video sequences. Finally, its large monitor display with touch-screen controls provides an intuitive user experience, and the luxury of a highly customizable user interface. Overall, PHILIPS / FEI XL20 offers a great combination of features and performance, ideal for imaging and analysis tasks in multiple industrial and scientific disciplines.