Used PHILIPS / FEI XL 30 (ESEM) #9378140 for sale

FEI XL30 is a scanning electron microscope (SEM) that provides high-resolution imaging of nanostructures and nanomaterials. The instrument is equipped with a PHILIPS XL30 field emission gun (FEG) and a PHILIPS / FEI linear SE detector for energy-dispersive X-ray analysis (EDX ). The XL30 is capable of obtaining the highest quality images compared to any other SEM in its class. The high resolution images are due to the FEG's low electron emittance and low thermal emittance. These characteristics allow for low-dose operation and higher magnification to produce high contrast images with low noise. Additionally, the EDX system enables the user to identify the elemental composition of the sample. The user can easily acquire images with various magnifications up to 600,000x. Working distance, tilt, and contrast can be changed from the PC console without any hardware adjustments. Images can be acquired in various modes such as brightness, backscatter, and others. The vehicle guidance system in the XL30 greatly simplifies the operation and alignment of the sample stage. Sample stages are available in several versions to cover a wide range of applications and types of samples. The XL30 features a unique "Go To" position that automatically guides the sample stage to the nearest position. This greatly reduces alignment time of the sample in the X, Y, and Z axes. The "Go To" feature also allows for automated sample space manipulation and traversing to scan wide areas of a sample or find a specific point of interest. Overall, FEI XL30 is a very powerful SEM with excellent imaging capabilities and a wide range of scanning options for both research and industrial applications. With its unique "Go To" function and extended sample stages, the XL30 can provide the user with high resolution images of nanostructures and nanomaterials.