Used PHILIPS / FEI XL 30 FEG #9184962 for sale

PHILIPS / FEI XL 30 FEG is a scanning electron microscope (SEM), designed to produce high-resolution images of the surface of a sample. It uses focused beams of electrons to generate images of the sample, providing powerful analytical capabilities. FEI XL 30 FEG uses a field emission gun (FEG) to generate an electron beam. The FEG is the most advanced electron source used in SEMs, and enables extremely high magnifications and superior resolution. The beams are scanned over the sample in a raster pattern, with the image formed by detecting the electrons that are backscattered or emitted from the sample. PHILIPS XL 30 FEG is equipped with a range of features to improve performance, including a large chamber holding up to 500mm x 700mm specimens, dual LN/Ar guns for low vacuum, an Ultra High Vacuum (UHV) chamber and an automated sample transfer system. It also has an in-column energy filter, allowing the user to select the energy of the beam to achieve the level of contrast required. XL 30 FEG also includes a wide range of detectors, including four types of SE (secondary electron) detectors, two types of BS (backscattered electron) detectors and an Energy Dispersive X-Ray Spectrometer (EDS). This range of detection systems provides a wide range of analytical capabilities, such as elemental analysis and composition. PHILIPS / FEI XL 30 FEG is controlled using a Windows-based GUI. This allows the user to adjust parameters such as imaging resolutions, vacuum levels, and the timing of the vacuum cycle. The microscope also has automated automation features, such as automated focus, to make operation simpler. FEI XL 30 FEG is a powerful SEM designed to meet the needs of advanced analytical applications. With its excellent resolution, automated automation features and wide range of analytical capabilities, it is a reliable and versatile tool for studying a wide variety of materials.