Used PHILIPS / FEI XL 30 SFEG #293741764 for sale

PHILIPS / FEI XL 30 SFEG is a powerful and versatile scanning electron microscope (SEM) that can be used to image both hard and soft samples. It has an impressive Magnification range up to 300,000x and can achieve resolutions down to 1nm. This SEM has a sophisticated Energy Dispersive X-Ray Spectroscopy (EDS) detector which can be used to determine chemical compositions of the samples being studied. Additionally, it has a High Resolution Digital Scan Control (HRDCS) system that allows for precise control over the imaging velocity and scan size. The SE signal can also be used to generate digital images with up to 16 bit color depth. FEI XL 30S FEG is a low vacuum SEM, meaning that it does not require a specialized vacuum chamber setup or maintenance in order to operate. This makes it an ideal choice for applications in materials science, geology, and other disciplines where a versatile imaging setup is needed. The detector design allows for both secondary and backscattered electron imaging, as well as Electron Beam Induced Current (EBIC) imaging. Electron Backscatter Diffraction (EBSD) and Low/High Angle Swift Heavy Ion (L/HA-SHI) imaging is also possible with the addition of a special orientation control device. An automated specimen stage with three-axes of automated motion is included, allowing for precise control over the sample positioning. The stage is also equipped with a pre-alignment option, which allows users to quickly mount samples and get up and running quickly. The flexibility offered by the pre-alignment option has a variety of applications, from rapid verification of mounting procedures to automated imaging of multiple samples. PHILIPS XL30 S-FEG also features automated positioning and measurement capabilities that can be used to generate repeatable images at up to 33 frames per second. This makes it an ideal solution for high throughput imaging applications. Additionally, automated tilt and rotate capabilities are available, allowing for in-depth analysis of the sample structure. Overall, XL 30 SFEG is a robust and advanced scanning electron microscope, capable of producing high quality images that can be used for a wide variety of research and industrial applications. Its powerful features and versatility make it an ideal choice for researchers who need an all-in-one imaging system.