Used PHILIPS / FEI XL 30 SFEG #9255918 for sale

PHILIPS / FEI XL 30 SFEG is a scanning electron microscope (SEM) that is ideal for both general and research applications. FEI XL 30S FEG employs a high-resolution Schottky field emission gun (FEG) for accurate and detailed imaging. It features an automated sample exchange equipment for quick and easy sample handling and preparation. The configuration allows for remarkable through-the-lens imaging and superior performance in electron microscopy. PHILIPS XL30 S-FEG utilizes an advanced UltraHigh Resolution (UHR) electron optics system with an energy dispersive spectroscopy (EDS) unit for elemental analysis. The machine features a 4k x 4k high performance detector that allows for analyses of ultra-small objects. This tool provides exquisite depth of focus, a large field of view, and superior imaging of nanoscopic details. PHILIPS XL 30 S-FEG has a wide range of specimen measurement capabilities. It enables users to measure measure high-resolution images, nanoparticles, and thin films with nanometer precision. The asset also provides energy filtered imaging (EFI) to improve the visibility of specific features within images. XL 30 SFEG utilizes a vacuum chamber and turbo molecular pumping model to maintain a low vacuum environment for optimal imaging and analysis. This low-vacuum condition prevents artifacts from forming and ensures high-resolution images. The microscope has an environmental chamber option that enables users to measure specimens under a variety of atmospheric conditions. FEI XL 30 S-FEG is powered by software and a graphical user interface (GUI) that allows users to control the microscope operation and automates routine tasks. It provides access to powerful analysis tools for imaging and analysis. The software is very user-friendly and straightforward, allowing users to quickly carry out advanced functions without much prior knowledge. Finally, PHILIPS XL 30 SFEG is a powerful and versatile scanning electron microscope that is perfect for general and research applications. It provides users with excellent imaging capabilities for applications such as nano-scale material analysis and thin-film inspection. The comprehensive packages of features, accessories, software, and user-friendly interface makes it an excellent instrument for a variety of electron imaging and analysis applications.