Used PHILIPS / FEI XL 30 SFEG #9390243 for sale

PHILIPS / FEI XL 30 SFEG is an advanced scanning electron microscope (SEM) capable of imaging a variety of specimens. It utilizes low voltage, high voltage, and variable pressure scanning modes, allowing it to visualize a wide range of samples with unprecedented detail. Standardly equipped with Oxford AZtec energy dispersive spectroscopy (EDS) for elemental analysis, FEI XL 30S FEG is a state-of-the-art microscope for the modern materials scientist. PHILIPS XL30 S-FEG is based off of a low vacuum field emission electron gun (FEG), with the added ability to use variable pressure scanning and an effective accelerating voltage range from 2-30kV. It has a spatial resolution of up to 1.25nm and boasts a short pulse duration for images with minimal charging artifacts. The FEG electron source also allows for an influx of electrons, which can be tailored to achieve a wide variety of imaging modes, such as backscatter imaging, secondary electron imaging, and simultaneous spectroscopic imaging. Additionally, PHILIPS XL 30S FEG is equipped with ZWN Automation, a feature that allows integration of multiple microscopy instruments such as SEM, STEM, and BIC for comprehensive studies. The Oxford AZtec EDS spectrometer on FEI XL 30 S-FEG is great for elemental analysis. With its fast, automated mapping features, MAPS analysis down to 0.1m is achievable. It has an elemental range from boron (B) to uranium (U) and is capable providing quantitative data with high accuracy. XL30 S-FEG has automated functions on the large touch screen interface with application-specific detectors. These detectors manage beam current, signal digitizing, and image capture, allowing for the manipulation of image parameters that result in high-contrast, low noise images. Additionally, many post-processing filters are available to enhance contrast, blur, sharpening, and coloring. Overall, PHILIPS / FEI XL30 S-FEG is an excellent choice for those who require an advanced, high-performance SEM. Its wide range of imaging capabilities, enhanced imaging parameters, and elemental analysis capabilities makes it an exceptional choice for research and industrial applications.