Used PHILIPS / FEI XL 30 Sirion #293586485 for sale

PHILIPS / FEI XL 30 Sirion is a highly-advanced and powerful scanning electron microscope (SEM) that provides a combination of advanced imaging capabilities and precision analysis capabilities. It is designed to meet the needs of users who require high-resolution imaging as well as complex scanning and analysis capabilities. The Sirion is equipped with a durable vacuum chamber and high-performance detector systems, allowing it to provide electron imaging with a resolution of down to 0.7 nm. The electron beam-specimen interaction in both an electron gun and a secondary electron detector are used to achieve maximum resolution and contrast for a variety of imaging and analytical needs. In terms of imaging capabilities, the Sirion offers several methods, such as bright-field imaging, by imaging reflected electrons and dark-field imaging, by imaging secondary electrons. The high-voltage capabilities make it possible to obtain various magnifications, giving contrasting features on the image. The Sirion is also capable of high-resolution elemental analysis by energy-dispersive X-ray spectroscopy (EDX) and cathodoluminescence (CL). This enables users to identify chemical elements or compounds in a sample and determine their abundance. The system's spectroscopy capabilities also include auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS), for performing advanced analytical experiments. For high-throughput applications, the Sirion offers the advantage of automated navigation, with automated navigation points and the ability to generate automated navigation paths. Additionally, the Sirion can provide automatic focus and alignment, allowing for precise and detailed imaging. In addition, the Sirion's software has been developed to provide sophisticated image processing capabilities and analysis capabilities. This includes image enhancement, automated measurement, and 3D visualization. The software also provides the ability to create custom post-processing profiles and the ability to export images and analysis results to other programs. Overall, FEI XL 30 Sirion is an advanced and powerful scanning electron microscope that provides users with a number of imaging and analysis capabilities. Its high resolution and advanced automated features allow users to easily perform sophisticated experiments and obtain high-quality results.