Used PHILIPS / FEI XL 30 Sirion #293614803 for sale

PHILIPS / FEI XL 30 Sirion is a powerful scanning electron microscope (SEM) capable of providing high-resolution imaging and analysis for scientists and researchers. The Sirion has a maximum spatial resolution of 1.2nm, allowing for high-level imaging and analysis of materials that can detect even the finest microstructural features. The Sirion is equipped with a new electron optical equipment that has improved optics and a higher acceleration voltage. This allows it to be used in a variety of applications, such as imaging and analysis of nanoscale materials and as a tool for examining microcircuits. The Sirion also includes an Energy Dispersive X-ray Spectroscopy (EDX) system with a wavelength-dispersive x-ray (WDS) detector. This unit allows for elemental analysis of samples and can be used to perform accurate and complete compositions. The Sirion can be used in a variety of imaging and analysis techniques such as backscattered electron imaging (BSE), secondary electron imaging (SEI), plan-view imaging and probing, and low vacuum imaging. The Sirion also supports advanced imaging techniques such as a Beam-Shifting Image Correction Machine (BSICS) for distortion-free images and automated data acquisition. The Sirion also features a suite of sample manipulation capabilities, including a high precision sample stage and vacuum feed-throughs. This allows samples to be aligned and manipulated while still in vacuum, eliminating the need for sample preparation in air. The Sirion also includes a specimen exchange tool, which enables easy switching between samples without breaking vacuum. Overall, FEI XL 30 Sirion is an advanced scanning electron microscope asset that provides superior imaging resolution, elemental analysis capabilities, and automated data acquisition. It is an ideal tool for scientific and industrial applications, offering a variety of imaging capabilities and user-friendly features.