Used PHILIPS / FEI XL 30 Sirion #293624757 for sale

PHILIPS / FEI XL 30 Sirion is a scanning electron microscope (SEM) designed to deliver exceptional imaging, analytical and sample preparation results in a range of applications and research areas. Its SEM column incorporates a Thermo Fisher Scientific engineered electron source which extends its operating life and improves its performance. FEI XL 30 Sirion also features an advanced electron optics equipment which allows for high-resolution imaging capabilities with greater detail than traditional SEMs. PHILIPS XL 30 Sirion is equipped with the ability to conduct a variety of versatile sample analyses including chemical, structural and elemental analysis. Its advanced electron optics system has the ability to take a sample from the initial state to the nano-structure level. This allows users to view & measure the sample's elemental content, as well as its topology, all in one go. The instrument can also be used to target certain elements within a sample and determine the bonds between them. XL 30 Sirion includes an advanced feature set that includes a higher Magnification Range (up to 590 kV) for enhanced imaging and analysis capabilities, high-resolution imaging with greater probe current of up to 10 μA with variable current adjustment. This unit also offers a user-friendly touchscreen display for easy operation, as well as machine diagnostics and error logging for troubleshooting. The Sirion also stands apart from typical SEMs with its automated automated advanced sample preparation techniques. These techniques facilitate sample preparation for faster, more precise imaging and analysis, reducing the number of user errors. It is designed to accommodate a wide range of sample dimensions, which is ideal for researchers or industrial users with varying sample sizes. PHILIPS / FEI XL 30 Sirion also has a wide range of viewing, measurement and analytical capabilities. These include automated stig and tilt adjustment, automated astigma corrections, high-resolution imaging, 3-dimensional imaging and feature recognition, compositional mapping and analysis, elemental composition and depth profile analysis, isoline resolution and contouring, multiple detectors and synchronized imaging, and automated drift correction.