Used PHILIPS / FEI XL 30 Sirion #293644232 for sale
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PHILIPS / FEI XL 30 Sirion is a high-performance scanning electron microscope (SEM) that is used for a wide variety of research and diagnostic applications. It is equipped with advanced features to achieve fast, accurate results. FEI XL 30 Sirion has a variety of detection capabilities, including secondary electrons, backscattered electrons, and reflection electrons. It also has a high base voltage of 30 kV for improved resolution, as well as a high-coherence electron source for quick acquisition of data. The separate backscatter detector is capable of obtaining both surface topography and elemental analysis. PHILIPS XL 30 Sirion has an axial movement of 1200 mm, with a sub-micron repeatability for precise specimen placement in the chamber. It also has a high-magnification lens with a working distance of 5.5 mm to enable a wide variety of sample sizes and shapes. A wide collection of specimen holders is available to accommodate a full range of specimen types. XL 30 Sirion is easy to operate with an intuitive user interface, and it has automated features that enable quick alignment and specimen acceptance. A variety of imaging tools are available to provide valuable visualization of data, including: four-dimensional tomography, dual-beam imaging, and EDS. PHILIPS / FEI XL 30 Sirion is ideal for applications that require quick operation, accurate results, and advanced imaging capabilities. Its reliable performance and efficient operation make it an ideal choice for a variety of research and diagnostic applications.
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