Used PHILIPS / FEI XL 30 Sirion #9108125 for sale

PHILIPS / FEI XL 30 Sirion is a scanning electron microscope (SEM) offering the latest in advanced surface imaging and analysis for disciplines in materials science, industrial quality control and life sciences. This versatile SEM combines an innovative technique characterized by high resolution and high throughput with a reliable, easy-to-use design. Its unique design allows extended depth of field imaging, while its automated stage provides the ability to acquire large areas without interruption. FEI XL 30 Sirion produces images of unprecedented clarity and detail, with a lateral resolution of up to 0.9 nm and an imaging resolution of up to 70 nm. It features a range of imaging modes, such as backscatter imaging, the Next Generation EDS system (for chemical analysis), low vacuum imaging, and high-angle annular dark field (HAADF) for contrast and texture analysis. It also has digital video capabilities for one-time imaging of processes. PHILIPS XL 30 Sirion features a unique Automated Acceleration Control system (AAC), which ensures optimum and repeatable acceleration performance. This ensures that collected data remains consistent. Its advanced SE and BSE detectors can collect from 5-200 keV, with low noise levels and high sensitivity. XL 30 Sirion has an automated stage which allows for larger area acquisitions without interruption. It can be moved in three dimensions, up to 200 mm X 200 mm, while also providing diagonal movements for extended area continuous imaging. Its fully automated image registration technology precisely aligns images acquired in multiple field of views to provide an overview of a sample or surface area. PHILIPS / FEI XL 30 Sirion is a highly versatile and reliable SEM that offers users unprecedented clarity, detail and consistency of results. Its innovative features and extended depth of field imaging make this an ideal choice for applications in the fields of materials sciences, industrial quality control and life sciences.