Used PHILIPS / FEI XL 30 Sirion #9302635 for sale

ID: 9302635
Vintage: 2000
SFEG TMP Scanning Electron Microscope (SEM) FEG & Turbo vacuum pump have been replaced Motorized stages: X, Y, Z, R Other detectors: Detector: FEI / Type: FP 6848 Detector: FEI / Type: PW 6761 OXFORD EDS7231 detector: Material: Silicon- 133 eV Area: 10 mm² Heater: 5.1 V Substrate: 6.2 V Ramp: 1 fa Gas type: PT14+ Window type: ATW2 DBC Units: 1128-372 DBS Cable set: 1106-706 Noise / Resolution PT1: 141 / 185 PT2: 104 / 159 PT3: 80 / 144 PT4: 64 / 136 PT5: 54 / 132 PT6: 50 / 130 Performance test: Resolution: 131.9 eV FWHM at 5.895k eV (Mn) Standard deviation: 0.61 eV 120 Cycles ~2000 vintage.
PHILIPS / FEI XL 30 Sirion is a scanning electron microscope (SEM) that is perfect for advanced imaging applications. The equipment is integrated with an automated stage and image analysis capabilities, allowing for greater accuracy and precision during sample investigation. The XL 30 features a long-lasting thermionic electron source, along with an innovative 4k imaging technology for capturing highly detailed images of samples. The system has a wide range of operating parameters, giving accurate imaging results even at low operating current and low accelerating voltage - this is crucial for imaging delicate samples. In terms of imaging capabilities, the XL 30 is equipped with an easy-to-use secondary electron detector, allowing users to capture real-time images with incredible clarity and resolution. The unit also boasts a high-voltage scanning electron detector, which is capable of detecting different elements across the periodic table. Moreover, the machine supports multiple imaging techniques, these include; Back-scattered Electrons (BSE) imaging, Energy Dispersive X-ray (EDX) mapping and line scan analyses. The XL 30 comes equipped with automated stage capabilities, allowing users to easily move the sample around during imaging in both x and y directions. The automated stage also features an intuitive user interface, giving users the ability to customize the imaging process. The tool is also equipped with vacuum control systems to ensure proper pressure when imaging, ensuring every imaging process is of the highest possible quality. Advanced image analysis capabilities are also provided, allowing users to quickly manipulate and analyze results. The asset also comes with powerful software packages, offering an intuitive and stress-free way to achieve research goals. In addition to all this, FEI XL 30 includes an optional automatic sample changer, allowing users to quickly and easily switch between different samples with minimal disruption. In conclusion, FEI XL 30 Sirion is a highly capable scanning electron microscope, providing remarkable imaging and analytical capabilities. Its automated stage, long-lasting thermionic electron source, intuitive user interface and various imaging techniques make it the perfect choice for any research project.
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