Used PHILIPS / FEI XL 30 Sirion #9302635 for sale
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ID: 9302635
Vintage: 2000
SFEG TMP Scanning Electron Microscope (SEM)
FEG & Turbo vacuum pump have been replaced
Motorized stages: X, Y, Z, R
Other detectors:
Detector: FEI / Type: FP 6848
Detector: FEI / Type: PW 6761
OXFORD EDS7231 detector:
Material: Silicon-
133 eV
Area: 10 mm²
Heater: 5.1 V
Substrate: 6.2 V
Ramp: 1 fa
Gas type: PT14+
Window type: ATW2
DBC Units: 1128-372
DBS Cable set: 1106-706
Noise / Resolution
PT1: 141 / 185
PT2: 104 / 159
PT3: 80 / 144
PT4: 64 / 136
PT5: 54 / 132
PT6: 50 / 130
Performance test:
Resolution: 131.9 eV FWHM at 5.895k eV (Mn)
Standard deviation: 0.61 eV
120 Cycles
~2000 vintage.
PHILIPS / FEI XL 30 Sirion is a scanning electron microscope (SEM) that is perfect for advanced imaging applications. The equipment is integrated with an automated stage and image analysis capabilities, allowing for greater accuracy and precision during sample investigation. The XL 30 features a long-lasting thermionic electron source, along with an innovative 4k imaging technology for capturing highly detailed images of samples. The system has a wide range of operating parameters, giving accurate imaging results even at low operating current and low accelerating voltage - this is crucial for imaging delicate samples. In terms of imaging capabilities, the XL 30 is equipped with an easy-to-use secondary electron detector, allowing users to capture real-time images with incredible clarity and resolution. The unit also boasts a high-voltage scanning electron detector, which is capable of detecting different elements across the periodic table. Moreover, the machine supports multiple imaging techniques, these include; Back-scattered Electrons (BSE) imaging, Energy Dispersive X-ray (EDX) mapping and line scan analyses. The XL 30 comes equipped with automated stage capabilities, allowing users to easily move the sample around during imaging in both x and y directions. The automated stage also features an intuitive user interface, giving users the ability to customize the imaging process. The tool is also equipped with vacuum control systems to ensure proper pressure when imaging, ensuring every imaging process is of the highest possible quality. Advanced image analysis capabilities are also provided, allowing users to quickly manipulate and analyze results. The asset also comes with powerful software packages, offering an intuitive and stress-free way to achieve research goals. In addition to all this, FEI XL 30 includes an optional automatic sample changer, allowing users to quickly and easily switch between different samples with minimal disruption. In conclusion, FEI XL 30 Sirion is a highly capable scanning electron microscope, providing remarkable imaging and analytical capabilities. Its automated stage, long-lasting thermionic electron source, intuitive user interface and various imaging techniques make it the perfect choice for any research project.
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