Used PHILIPS / FEI XL 30 Sirion #9404297 for sale

PHILIPS / FEI XL 30 Sirion is a scanning electron microscope (SEM) that delivers an advanced imaging experience. This SEM features a particle optic module with a field emission gun (FEG) electron source and an extensive range of high end imaging accessories. FEI XL 30 Sirion is considered a high-end instrument for SEM imaging and analytical applications due to its superior image quality and resolution. PHILIPS XL 30 Sirion features a variable pressure (VP) electron column with a unique "pepper pot" ion lens. This innovative design allows for a more stable electron beam and improved surface sensitivity, even at ultra-high magnifications. The imaging equipment utilizes an UltraVac, a multi-mode vacuum system capable of working within both ultra-high and ultra-low resolution environment, and offers a variety of imaging modes To take advantage of the new capabilities of the VP column and UltraVac unit, XL 30 Sirion offers several imaging modes including SE, BSE and CSE. PHILIPS / FEI XL 30 Sirion is also capable of producing extremely high crystallographic resolution. This is made possible due to the combination of a high resolution (HR) imaging mode and the new UltraVac machine. The HR mode features a maximum spot size of 0.7 nm and resolution up to 1 nm. The UltraVac tool helps minimize beam distortion and makes HR imaging possible. In addition to advanced imaging capabilities, FEI XL 30 Sirion also offers several analytical capabilities. These include energy-dispersive X-ray (EDX) spectroscopy, electron backscatter diffraction (EBSD) and energy-filtered imaging (EFI). The EDX, EBSD and EFI functions allow users to identify material composition and gain an understanding of crystallographic structure and orientation. PHILIPS XL 30 Sirion combines the latest in technology with user-friendly operation, making it easy to use. Its robust design and reliable performance make it ideal for research, industrial and educational use. XL 30 Sirion is a powerful scanning electron microscope that offers a superior imaging experience and makes advanced analytical applications possible.