Used PHILIPS / FEI XL 30 #192152 for sale

PHILIPS / FEI XL 30 is a scanning electron microscope (SEM) designed to provide the highest resolution imaging of a sample. FEI XL 30 is able to acquire and analyse images in the range of 0.2 angstrom, ensuring that even the smallest of details are revealed. Its in-lens system allows for a large range of sample-surface interactions when combined with a wide range of electron beam energies. These electron beams interact with the sample in three ways: secondary electrons, backscattered electrons, and transmission electrons. Secondary electrons originate from sample surfaces and contain surface topographic information. Backscattered electrons are generated when high mass, high-speed electrons collide with the sample and solid matter and contain crystallographic and elemental information. The strongly penetrating transmission electrons are unaffected by the sample and are used to detect subsurface phenomena. The exploration capabilities of the instrument are further enhanced by variable pressure SEM technology and variable pressure detectors. The variable pressure SEM can significantly decrease or even eliminate specimen charging and artifact formation in biomaterials, polymers and even plastic samples for imaging and analysis without the need for conductive coatings. Variable pressure detectors enable the analysis of energy selected electrons which are produced and deflected from the length of the column and into the channeltron detector. As an analytical tool, PHILIPS XL30 is capable of providing SEM images, magnified up to 800,000x, with a resolution of 0.2 angstroms, elemental information using energy dispersive spectrometry (EDS) mapping, and line scanning. In addition to SEM imaging, PHILIPS / FEI XL30 can also be used to heat, cool and cut into the sample, allowing for confocal and 3D analyses. These capabilities makes XL30 a powerful instrument for analysing and characterizing a variety of materials on a molecular level. XL 30 is designed to provide the highest resolution imaging performance with an in-lens system to provide a wide range of interactions with the sample, variable pressure SEM capabilities to reduce or eliminate specimen charging, and detailed analysis capabilities such as EDS mapping and line scanning. This makes FEI XL30 an invaluable tool for any laboratory looking to gain an in-depth understanding of the composition and structure of a sample.