Used PHILIPS / FEI XL 30 #293610605 for sale

PHILIPS / FEI XL 30 is a high performance scanning electron microscope (SEM) designed to provide superior resolution and analysis. It can be used to study a wide variety of samples and has a magnification range of up to 160,000x. FEI XL 30 is equipped with three electron detectors, allowing users to analyze a range of specimen data including composition, topography, and elemental distribution. The integrated digital RGB microscope camera allows for all-digital imaging and observation of samples, and the software suite includes a powerful range of analytical functions. The versatile PHILIPS XL30 is composed of five main components, which together create a user-friendly analytical equipment. The electron gun is composed of a heated filament which sends a fine beam of electrons to the sample, and this is directed by the electromagnetic lens system. The specimen is mounted in the sample holder and is electrically isolated from other parts of the microscope's components. The electron detector then collects and displays data from the beam onto the display. XL30 can be operated in either a low or high-energy mode, depending on the type of analysis being conducted. In the low-energy mode, the unit provides high-resolution imaging of surface structures and composition, as well as elemental distribution. In the high-energy mode, the machine can be used to obtain information on surface topography and bulk material characteristics. The SEM tool is equipped with specimen changers, allowing automation of sample loading and scanning processes, and it is equipped with a modern user-interfaces which allow users to quickly create and access the software settings needed for their analysis. XL 30 also features comprehensive imaging and analytical capabilities, providing users with a comprehensive range of features. The integrated ImageJ software allows for advanced imaging in both brightfield and darkfield modes. In addition, FEI XL30 has a range of powerful analytical tools that can be used to analyze specimen data such as EDS (energy dispersive X-ray spectroscopy), WDS (wavelength dispersive X-ray spectroscopy), SEM tomography and automated digital image analysis. Overall, PHILIPS XL 30 is an advanced and high-performance SEM asset that provides researchers with a wide range of imaging tools and analytical capabilities. It is extremely user-friendly and offers a complete solution to visualize and analyze a wide range of sample types.