Used PHILIPS / FEI XL 30 #293618038 for sale

PHILIPS / FEI XL 30 is a scanning electron microscope (SEM) designed to allow researchers and scientists to collect information and data on a microscopic level. It utilizes a wide variety of capabilities and features to produce high-resolution images, as well as allowing for extended studies of object surfaces. The unit is composed of a variety of components, including an electron source, scanning controller, electromagnetic lenses, specimen preparation chamber, digital imaging device, and a vacuum system. The electron source produces a beam of electrons, which are then manipulated in various ways by the magnetic lenses, controlled by the scanning controller. The low-voltage scanning electron microscope allows for imaging of specimen surfaces in detail with resolutions as low as nanometers. An integrated micro-manipulator can be used for positioning the emitted electrons for accurate surface examination. The vacuum system maintains the internal environmental of the machine, as a vacuum is essential for the correct operation of the system. For specimen preparation, the microscope provides heating and cooling stages integrated into the specimen chamber. This allows for flexible studies of the sample, including a variety of temperatures and pressures. The digital imaging device is capable of capturing images of both the microscopic and macroscopic level. FEI XL 30 is suitable for a range of materials and surfaces, including metals, ceramics, plastics, and biological specimens. The unit is small in size, lightweight, versatile and is easy to operate. It allows researchers and scientists to accurately and reliably analyze small samples while collecting detailed information on surface topology.