Used PHILIPS / FEI XL 30 #293619811 for sale

PHILIPS / FEI XL 30 is a scanning electron microscope (SEM) designed for imaging and analyses at a submicron level. It features an energy dispersive X-ray spectrometry (EDS) system and a field emission gun with aberration correction. FEI XL 30 offers three imaging modes: secondary and backscattered electron (BSE) imaging or a low voltage imaging mode that uses lower kV for improved performance at high magnifications. PHILIPS XL30 can reach magnifications up to 500,000x with a resolution of 0.750nm, a pressure window of 0.35-420PA, and a chamber size of .5 x .6mm. The detector system consists of a bimodal detector, a secondary electron detector, and an energy dispersive X-ray (EDX) detector. The bimodal detector includes a curved non-reflecting detector, a synchronizing pulse detector, and an open-flow spot detector. The secondary electron detector measures the emitted electrons and is equipped with an annular slit that allows for a finer tunable path resolution. The EDX detector enables elemental analysis and is equipped with an antiscatter grid and an aluminum X-ray window. FEI XL30 can analyze samples at low and high vacuum. A sample chamber is used to introduce the sample and the environmental conditions are controlled to reduce the influence of moisture and contaminants on the sample. A heating stage can be used to heat the sample to a maximum of 3000°C. PHILIPS / FEI XL30's user interface can be programmed to control all the microscope settings and to store default values for all settings. The user can store and retrieve full profiles for each imaging mode. The user also has multiple options for controlling the viewing angle, magnification and beam shape. XL30 offers a range of analysis possibilities, including electron micrography, characterization, surface topography, elemental analysis and spectroscopy, failure analysis, and tunnelling. Its performance is further enhanced by aberration correction (CAC) and kV reduction technology. The system's high stability and low noise floor allows users to make precise measurements, while its accuracy and consistency gives reproducibility of results.