Used PHILIPS / FEI XL 30 #293636316 for sale

PHILIPS / FEI XL 30 is a scanning electron microscope (SEM) used for imaging and analysis at the nanoscale. It is used to analyze the surface topography of materials and biological samples in high resolution. It features an automated stage with a scanning area of 200 x 350 mm and a Fast Scan detector for fast imaging. The scan rate is up to 500 Hz with a maximum resolution of 1 nm/pixel. It is also equipped with a low vacuum mode for imaging samples that require less than 50 Pa. FEI XL 30 has many advanced imaging capabilities. It is equipped with an electron beam-induced current detector, which measures the material's electrical properties. It also has an energy dispersive X-ray analysis (EDX) system, which enables elemental analysis of sample surfaces. Additionally, it includes both bright field and dark field detectors for sample characterization. In addition to imaging capabilities, PHILIPS XL30 also offers many advanced analytical capabilities. It is equipped with a backscatter detector that can be used to measure the thickness of sample layers. The combined elemental and structural analysis capability provides a complete picture of sample surfaces. It also features advanced on-axis electron holography, which can measure stress and strain in materials. Moreover, XL 30 has a charge neutralizer that prevents image distortion caused by charging of the sample. This provides accurate imaging and analysis, even with samples that are prone to charging. It also features an integrated cryogenic stage for high resolution imaging at low temperatures, and a spectroscopic detector for detailed chemical analysis. Overall, PHILIPS / FEI XL30 is a powerful scanning electron microscope with a range of advanced imaging and analytical capabilities. It is ideal for characterization of materials and biological samples, providing researchers with unparalleled insight and understanding.