Used PHILIPS / FEI XL 30 #293643959 for sale

PHILIPS / FEI XL 30 is a scanning electron microscope (SEM) designed for imaging and analysis of a wide range of materials and structures. This versatile microscope is well-suited to both low and high magnification imaging, and can be used in both in situ and environmental scanning electron microscopy applications. FEI XL 30 incorporates field-emission gun (FEG) technology for maximum performance and stability. This FEG source allows for electron beam currents down to 2pA, enabling imaging in low voltage scanning electron mode. The high current FEG source also allows for increased scanning speed and higher image resolution at higher magnifications. PHILIPS XL30 also features a large chamber capacity that can accommodate specimens up to 450 mm in size, and a wide range of sample orientations. This allows the microscope to be used to analyse even the most challenging samples. In addition, XL30 includes a unique Autoload III specimen loading system and a range of imaging detectors, including a scintillator detector for optimized imaging of highly contrasting specimens and a backscatter detector for imaging non-conductive materials. XL 30 can also be operated in environmental SEM (ESEM) mode for imaging and analysis of samples that cannot be imaged with conventional SEM. When operating in ESEM mode, PHILIPS XL 30 maintains a clean, stable vacuum environment while at the same time allowing the sample to be maintained under gaseous atmospheres. This allows for imaging of delicate biological samples such as specimens in liquids and cell cultures. Finally, PHILIPS / FEI XL30 is equipped with a range of high-performance analysis software, such as TelED, an automated image analysis package designed for image analysis and interactive 3D visualisation. This software is capable of measuring features such as area, perimeter, line profile, and volume, as well as integrated energy dispersive spectroscopy (EDS) capabilities. In conclusion, FEI XL30 is a scanning electron microscope designed for imaging and analysis of a wide range of materials and structures. The versatile design, FEG source, and range of detectors and analysis software make PHILIPS / FEI XL 30 an ideal tool for a range of SEM and ESEM applications.