Used PHILIPS / FEI XL 30 #293644231 for sale
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PHILIPS / FEI XL 30 is an advanced electron microscope equipped with a field-emission gun for use in scanning electron microscopy (SEM). The microscope is designed with a maximum accelerating voltage of up to 30 kV and an ever-improving depth of focus and resolution to enable a more detailed and accurate examination of specimens. It operates in three modes, including SEM, low-kV STEM and high-kV STEM. The x-ray microanalysis capabilities of FEI XL 30 enable SEM-based elemental mapping and coating. With the press of a button, the microscope's auto-focusing system performs fast and accurate sample focusing with minimal noise. PHILIPS XL30 is equipped with a high-temperature manipulator, enabling the placement of samples at pressures up to 50 torr and temperatures up to 2000°C. The manipulator helps to reduce sample drift and makes the sample more contact-resistant to the scanning probe. Additionally, it greatly enhances the imaging quality of inhomogeneous samples. The instrument's large chamber allows for the attachment of a variety of detectors, such as LENS (Lateral Electron focusing System), for 3D experiments that involve a combination of low and high resolution imaging. Furthermore, the chamber is equipped with specimen holders for morphology and phase imaging, as well as the sample stage to ensure spectroscopic and imaging in various irradiation modes, including in-vacuum, high-vacuum, and ultra-high vacuum. FEI XL30 provides sterile and isolated environments to maximize signal clarity and image accuracy. Its advanced optics system also offers enhanced sensitivity and signal-to-noise ratio. In addition, the microscope is designed with an ergonomic user interface that facilitates intuitive operation. The combination of its advanced features, such as a maximum accelerating voltage of up to 30 kV, a high-temperature manipulator, and a large chamber, make XL30 an ideal tool for performing a wide range of microscopy tasks. Its easy-to-use user interface, reliable imaging quality, and high resolution are just some of its advantages. Furthermore, its various detectors and sample holders enable high-resolution imaging, spectroscopy, and 3D analysis that would otherwise not be possible.
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