Used PHILIPS / FEI XL 30 #293757338 for sale
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ID: 293757338
Scanning Electron Microscope (SEM)
Resolution: 1.5 nm @10 kV or >2.5 nm @1 kV
Voltage: 500 V - 30 kV
Magnification: 30x - 600000x
Detectors: SE, BSE, In-lens
Resolution: 4k x 3k
Stage:
X, Y Travel: 50 mm x 50 mm
Rotation: 360°
Tilt: -15° to 75°
Compucentric rotation
Working distance: 1-60 mm.
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