Used PHILIPS / FEI XL 30 #293757338 for sale

ID: 293757338
Scanning Electron Microscope (SEM) Resolution: 3.5 nm @30 kV or >25 nm @1 kV Voltage: 0.2 – 30 kV Detectors: SE Back-scatter detector Specimen chamber CCD camera Stage: X, Y Travel: 25 mm x 32 mm Rotation: 360° Tilt: -15° to 75° Compucentric rotation Working distance: 10 mm Vacuum system: EDWARDS TMP EDWARDS Pre-vacuum rotary pump.
PHILIPS / FEI XL 30 Scanning Electron Microscope is a highly advanced tool for analysis of electronic components and materials. The microscope is fitted with digital imaging and secondary electrons, and it can be used on a range of samples sizes, including metallic and ceramic materials. The microscope is built around a long base and a vertical column, and it can be set up with five different objectives, giving higher resolution and higher magnification capabilities. It is equipped with both a built-in digital camera, and a secondary electron detector, which boosts the resolution of images to a far superior level than what is achievable by optical microscopes. These capabilities, combined with a wide range of accessories and applications, make FEI XL 30 an ideal tool for a range of advanced analysis tasks. The microscope is a highly advanced tool for semiconductor characterization, inspection and failure analysis, analysis of circuit boards, and materials characterization. It is extremely powerful, and offers high-resolution images of micro-structures, features and internal composition. Furthermore, the microscope is equipped with a wide range of accessories, including a gun assembly, gas pumps and full vacuum systems, a cryo-transfer unit, and a range of sample holders. These accessories make PHILIPS XL30 an ideal tool for a variety of advanced analysis and testing tasks, such as digital imaging, chemical analysis, film thickness measurements and defect characterization. XL30 was designed keeping performance and ease of operation in mind. It allows for fast and accurate measurements and analysis, and its user-friendly interface makes it simple to set up, operate and interpret data. The microscope is also extremely easy to maintain and upgrade, thus ensuring long-term reliable operation. Overall, XL 30 scanning electron microscope is an excellent tool for analyzing electronic components and materials. It is packed with state-of-the-art features, and its advanced imaging, analysis and accessories allow for a range of advanced tasks. The microscope is also easy to setup and use, making it an ideal tool for a range of users.
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