Used PHILIPS / FEI XL 30 #293771293 for sale

PHILIPS / FEI XL 30 is a scanning electron microscope (SEM) designed for high resolution imaging and analysis of surfaces and interfaces in a wide variety of materials ranging from nanoparticles to large structures. This SEM is capable of imaging with high throughput, resulting in detailed images down to 2nm of resolution. FEI XL 30 incorporates an automatic focus equipment and beam alignment for highest quality imaging. This SEM utilizes a low acceleration voltage lens for added user safety and an electron beam for imaging in the high vacuum environment. The in-column secondary electron detector produces excellent contrast and image detail. PHILIPS XL30 has an automated multi-stage system that provides high throughput sample analysis and handling capabilities. By manipulating the beam and sample stage, a variety of data can be collected in a single run, including both quantitative elemental mapping and morphology features. It also features an energy dispersive X-ray (EDX) spectrometer that uses the backscattered electrons to generate a spectrum of crystal structures and a dedicated electron backscatter diffraction (EBSD) detector to measure peak intensities. PHILIPS / FEI XL30 is capable of imaging in a variety of modes, such as bright field, dark field, and differential contrast. This SEM is equipped with a unique overpressure unit for sample ventilation and to prevent sample contaminants from entering the high vacuum environment. It also includes an advanced navigation machine for selecting and manipulating images. The sample is placed in a vacuum chamber and the sample environment is manipulated to create the desired imaging conditions. FEI XL30 also incorporates an image capture tool for direct and remote control of the SEM. The image capture asset records and processes each image from the SEM, allowing for easy review, archiving, and sharing of results. Overall, XL 30 is a powerful scanning electron microscope for detailed imaging and analysis of materials, allowing users to gain deeper insights into their samples. With its integrated features, such as its automated multi-stage model and advanced navigation equipment, this SEM provides an efficient and cost-effective analysis solution.