Used PHILIPS / FEI XL 30 #293799305 for sale

PHILIPS / FEI XL 30
ID: 293799305
Scanning Electron Microscope (SEM).
PHILIPS / FEI XL 30 is a scanning electron microscope (SEM) designed for light sample imaging and analytical applications. It is especially suited for imaging and analysis of surface topography, sample composition, and paper surface structures. FEI XL 30 is a variable pressure SEM with a minimum working distance of 30 mm and a maximum working distance of 200 mm. It features an resolution of 1.2nm at 3 keV with a digital signal processor (DSP) and a minimum electrons per pixel of 8. PHILIPS XL30 SEM is based on FEI XL series platform and incorporates several significant advancements. It has an enhanced automated intelligent stitching mode that enables a contiguous, repeatable field of view and a motorized depth of field adjustment. XL 30 also features advanced user-friendly software which includes dual 2D imaging, 3D tomographic reconstructions, spectral mapping, and energy-dispersive X-ray analysis for quantitative elemental analysis. PHILIPS XL 30 is equipped with an LMIS1 CCD camera with 4 megapixel resolution that produces high-quality images. The SEM is capable of producing images from 50nm to 25mm, depending on what application you are using. The sample environment module provides a range of customizable carriers, including SEM stands and automatable sample stages. Other notable features include a user-friendly graphical user interface (GUI) with four-variable design for multi-beam imaging, automated image alignment, variable sample tilt and stage scanning, variable depth of field, and variable working distance. The variable pressure SEM provides stable electron beams at low pressures, allowing for minimal electron beam bouncing and better imaging of nonconductive samples. XL30 SEM is a powerful yet user-friendly instrument that provides fast and reliable data. Its advanced features make it suitable for numerous analyses and imaging applications, including sample mapping, surface topography, particle size/shape analysis, sample composition and structure, depth profiling, and elemental analysis. PHILIPS / FEI XL30 SEM provides the flexibility and performance necessary for most laboratory applications, giving users the versatility and confidence to conduct reliable research.
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