Used PHILIPS / FEI XL 30 #293805730 for sale

Scanning electron microscopes are the premier tool for imaging and analysing the structural and elemental composition of a sample. PHILIPS / FEI XL 30 is no exception - an industry-leading analytical scanning electron microscope (SEM) that is equipped with a field-emission gun, providing a distinct advantage in resolution, performance and analytical capability. FEI XL 30 features a maximum acceleration voltage of 30 kV and a spot size of 300 nm, while the sample chamber is capable of a deflection angle of up to seventy degrees. This allows the user to access hard-to-reach material layers, enabling higher-resolution analysis and top-down imaging of sub micron features. PHILIPS XL30 also includes a titanium based gun, using an enhanced liquid metal ion source (LMIS) to integrate spectroscopes into the SEM. This facilitates energy dispersive spectroscopy (EDS/EDX), allowing for qualitative, semi-quantitative and quantitative elemental assignments for a wide range of elements. The advanced software package and user-friendly graphical user interface of PHILIPS / FEI XL30 make it simple to operate, and the flexibility of the system ensures maximum utilisation of the wide range of analytical capability. The system also offers a broad range of software packages, from automated particle analysis to spectroscopy, automated pattern recognition to automated orientation; all of which can be adapted for particular requirements. This ensures that XL30 can provide optimal solutions for sample preparation, imaging and analysis. In addition, FEI XL30 includes a range of detectors including a backscatter electron detector (BED) and a secondary electron detector (SED). The BED is optimised to provide contrast to various sample morphologies, while the SED provides an array of simultaneous contrast mechanisms to maximise detection of sample features. In summary, XL 30 is a sophisticated, versatile yet highly user friendly scanning electron microscope. It provides a suite of sophisticated software linked to advanced detection systems and versatile sample holders, making this a high-performance tool for the most advanced analytical needs.