Used PHILIPS / FEI XL 30 #293809599 for sale

PHILIPS / FEI XL 30 scanning electron microscope (SEM) is an advanced scientific instrument used to obtain images of the surfaces of solid objects on a microscopic level. This microscope has a unique capability to obtain images with greater depth, size and detail than other microscopes. FEI XL 30 is a fully integrated transmission scanning electron microscope, and a highly sophisticated piece of technology. It is an especially powerful tool for the investigation of nanostructures and cross sectional features on the microscale. It combines various detection systems like secondary electron (SE) imaging, signal electron (BE) imaging, and backscattered electron (BSE) imaging. This enables investigators to measure the 3D architecture within a specimen, to understand internal features, and to distinguish fine surface details. Furthermore, the "BackScatter technology" of this microscope allows for imaging of very large structures with enhanced 3D resolution. PHILIPS XL30 SEM is equipped with a unique "Smartbeam™" system, which includes a digital image processor and control system to increase image accuracy and contrast. This is done through automated adjustment of the electron beam current and potential. The system also includes an automated stage routine which allows for multiple rotating positions of the sample and further enhances depth of field. In addition, the automatic collector-limiter provides an enhanced contrast and reduced charging effects. The specimen chamber of PHILIPS / FEI XL30 SEM has been designed to provide an ultra-low vacuum environment. This prevents specimen damage and improves image quality. Furthermore, the microscope is equipped with a multi-filament electron source, providing low electron energy and low accelerated voltage. This reduces damage to specimens from the electron beam. PHILIPS XL 30 SEM is the ideal tool for both scientific research and industry. It provides high resolution, superior signal-to-noise image quality, and a broad range of imaging capabilities. The ease of operation and excellent reliability combine to make XL30 SEM the perfect choice for various applications, such as nano-materials research, micro-machining, failure analysis and non-destructive testing.