Used PHILIPS / FEI XL 30 #293822403 for sale

PHILIPS / FEI XL 30 scanning electron microscope is a high-performance instrument that utilizes an advanced electron beam to produce detailed imaging and analytical capabilities. The microscope has an in-column energy-dispersive x-ray spectrometer (EDS) that enables the user to collect elemental information with the visualization of composition in single isolated domains. The microscope also features a high-resolution backscatter electron detector for sample surface analysis. FEI XL 30 offers a range of imaging capabilities. The microscope's integrated STEM (scanning transmission electron microscope) capabilities enable high-resolution imaging with contrast enhancement. The platform offers multiangle STEM and additional spectral imaging abilities to improves contrast in special applications. Its in-built correlative imaging features allow correlative studies of different sample properties with the integrated Hitachi TM-3000 Electron Microscope (SEM-FIB) for viewing of the structure. PHILIPS XL30 offers a wide array of analytical techniques. Its in-column EDS equipment enables elemental analysis and provides mapping of samples at the microscale level. Also its in-column energy filtering system improves energy resolution. In addition, its integrated energy-loss spectrometers (EELS) records precise information on the binding energy of individual electrons and helps to examine complex molecules. FEI XL30 is driven by a concurrent imaging modes operate, a Windows-based platform that permits very large datasets to be collected with minimal delays between imaging steps. This maximizes the instrument's throughput, as well as its analysis ability by combining all the imaging modes. Finally, XL30 has a full complement of top-of-the-line accessories, including focused ion beam (FIB), for precise specimen machining and micromachining. It also has an automated sample handling unit for the collection of large and hazardous specimens, enabling a maximum sample load for the instrument. PHILIPS / FEI XL30 provides an entire suite of imaging and analytical capabilities at a very high throughput. Its in-column EDS and EELS capabilities can greatly enhance the accuracy in composition analysis, while its automated sample handling machine provide increased flexibility and expandability.