Used PHILIPS / FEI XL 30 #293831005 for sale

PHILIPS / FEI XL 30 is a high-performance scanning electron microscope (SEM) ideal for use in industrial, academic and governmental research. FEI XL 30 features powerful imaging capabilities that enable the user to view a range of materials and structures in great detail. The microscope is equipped with a high-resolution cooled back-scattered detector and Everhart-thornley detector, both of which improve contrast and resolution. The microscope employs the latest FEG (Field Emission Gun) technology, allowing for increased resolution, stability and image quality, even at high magnifications. This technology is further enhanced with a combination of optimized secondary electron and low-vacuum technology, which allows for superior imaging of both atomic and magnetic material and structures. PHILIPS XL30 also offers a wide range of digital imaging capabilities, such as Digital Image Processing and AutoMontage. FEI XL30 also features an advanced automation system which allows for easy and consistent operation over the microscope's lifespan. This automation system can detect and manage a range of parameters such as specimen movement, pressure, tilt, scan size and image resolution. PHILIPS XL 30 also features an automated stage control and an integrated task sequence system which enables the user to carry out a range of tasks quickly and efficiently. XL30 is designed for industrial, academic and governmental research use, with advanced features and superior imaging capabilities. Its superior imaging resolution, FEG technology and automated systems make PHILIPS / FEI XL30 an ideal choice for those wishing to perform detailed analysis and observations. The microscope's combination of low vacuum and secondary electron technology also allows the user to view atomic and magnetic material and structures, providing a comprehensive and detailed picture of the sample being observed.