Used PHILIPS / FEI XL 30 #9020247 for sale

ID: 9020247
SEM Tungsten emitter Windows NT operating system Fully integrated image storage ET type secondary electron detector Magnification range: 10x to 400,000x Accelerating voltage: 0.2 to 30 kV Drawer type door 5-axis stage (XYZRT) – XYR motorized with 50 mm travel in X and Y Manual tilt and Z adjustment (6) Available accessory ports.
PHILIPS / FEI XL 30 is a high performance scanning electron microscope (SEM) which provides superior imaging capabilities. It has a high resolution, fluorchromatic, and monochromatic features. FEI XL 30 offers a robust image quality and is optimized for analytical applications. The equipment features an advanced autofocus system for a precise image, and has a wide range of operating conditions for a variety of applications. PHILIPS XL30 scanning electron microscope has a large field of view and allows for fast scanning. It can achieve resolutions up to 15nm and offers a 10X field of view. The SEM also allows for simultaneous observation of up to four different elements. The unit's x-ray spectrum analysis capabilities enable quick analysis of energy dispersive spectroscopy (EDS). The EDS provides information about the elemental composition of the sample. PHILIPS / FEI XL30 has a variable pressure chamber which helps with organic samples or those with limited vacuum stability, such as fragile molecules and small specimens. The variable chamber also helps reduce charging and beam-induced damage on samples. Furthermore, XL30's stage is outfitted with automated stitching software, which allows for high magnification imaging of large samples. The machine can be operated in both low-and high-vacuum modes, which provide the flexibility to work on different types of samples. The integrated laser interferometer tool aids in stable focusing, even over large fields of view, while the automated stage enables automated imaging. Additionally, the automated data acquisition functions allow for fast, reliable imaging. Other features of XL 30 include an intuitive tiled user interface, comprehensive sample databases, and an automated imaging suite which supports a range of image analysis. The automated image post-processing capabilities, for example, enable users to quickly and accurately capture data. PHILIPS XL 30 is an advanced scanning electron microscope designed for precise imaging of a variety of sample types. Its wide range of features and functions makes it an ideal choice for researchers who need superior imaging and analysis tools.
There are no reviews yet