Used PHILIPS / FEI XL 30 #9062875 for sale

PHILIPS / FEI XL 30 is a powerful and versatile scanning electron microscope (SEM) for both field emission (FE) and accelated voltage (AV) SEM applications. It is a high-end, high-resolution SEM with a comprehensive set of accessories. FEI XL 30 features a unique gun control system that allows for either a field emission (FE) or acceleration voltage (AV) gun. The field emission gun provides a stable power source and is capable of reaching high electron beam powers, enabling precise imaging and analysis. The acceleration voltage gun is capable of yielding high resolution images at lower electron beam energies than an FE gun. PHILIPS XL30 has a maximum magnification of 100,000x and a working distance of up to 500 microns. It is equipped with a high-resolution, 3-axis sample stage that enables inverted and forward observation, as well as precise manipulation of the sample. PHILIPS XL 30 is capable of high-sensitivity imaging with a range of detectors, including an integrated ultra-low-vacuum (ULV) detector, and is compatible with a variety of detectors. It also has a large detector chamber, allowing for a wide range of sample sizes to be imaged. FEI XL30's main advantage is its ability to acquire, store and analyze large datasets, thanks to a high-capacity data storage system. It also includes a variety of software packages that are tailored for SEM imaging and analysis, allowing for automated data acquisition and storage. Additionally, XL30 SEM is ideal for imaging a variety of samples, including those with small features and those with low dielectric constants. It is capable of imaging non-conductive and difficult samples without the need for special sample preparation. Overall, PHILIPS / FEI XL30 SEM offers powerful capabilities for imaging and analysis of a variety of samples. It is equipped with a wide range of advanced features, allowing for precise and highly-accurate imaging and data acquisition.