Used PHILIPS / FEI XL 30 #9096263 for sale

PHILIPS / FEI XL 30 is a scanning electron microscope (SEM) used for a variety of materials characterization and imaging applications. FEI XL 30 is a high-performance SEM designed to provide high-resolution imaging and detailed analysis of materials. It is equipped with a goniometer, which allows for precise angular adjustment for sample orientation, and an auto-changeover unit for quick and easy changeover of vacuum and/or liquid nitrogen levels. The SEM also features a DualBeam Equipment, which provides both SEM and Focused Ion Beam (FIB) imaging capabilities. The system is equipped with an Everhart-Thornley detector, which allows for high resolution imaging from lower voltages, resulting in the lowest drift correction of any other SEM on the market. This unit also features an automated image stitching feature for easily analyzing large samples, and a Digital X-Ray Machine for high resolution semi-quantitative imaging of bulk samples. PHILIPS XL30 utilizes a Schottky field emission gun (FEG) and a Gatan Omega UltraScan interface, providing high stability and resolution. The tool is also capable of local area imaging and is equipped with a heavy-duty base that allows for sample mounting and loading. Its 5-axis HV sample stages have micro-motors, which enable more exact sample manipulation. As well as the sample stages, FEI XL30 has a variable spot size control, providing precise secondary electron control and isothermal sample temperature control. In addition to its imaging capabilities, XL30 is capable of chemical imaging with advanced Energy Dispersive X-Ray Spectroscopy (EDS). It also offers an array of advanced capabilities, such as fast and full automated navigation, low-vacuum sample preparation and imaging, and film deposition. With its exceptional imaging capability, XL 30 is a reliable and precise option for a variety of materials analysis applications.