Used PHILIPS / FEI XL 30 #9151973 for sale

PHILIPS / FEI XL 30 is a high-performance scanning electron microscope (SEM) designed to provide high-resolution imaging, superior image quality, and accurate elemental analysis. With its ultra-high resolution and advanced imaging capabilities, FEI XL 30 is ideal for materials characterization and 3D imaging, making it a valuable tool for scientists and engineers. PHILIPS XL30 is powered by a field emission gun (FEG) power source, which enables fast and effective imaging with a wide range of beam currents. This electron microscope features a large magnified viewing field of 150mm, enabling large samples to be observed. The large depth of field makes PHILIPS / FEI XL30 ideal for analyzing large scale surfaces and for imaging deep structures. For elemental analysis, PHILIPS XL 30 offers innovative advanced imaging capabilities such as energy dispersive X-ray spectroscopy (EDS) and wavelength-dispersive X-ray spectroscopy (WDS). With EDS, the elemental composition of a sample can be precisely determined, while WDS measures the local chemical composition at the sample surface. These techniques make it possible to accurately identify the structure and composition of samples at the highest level of detail. XL 30 provides non-destructive 3D imaging, making it possible to visualize surface features and internal structures. The microscope features an automated stage equipment and integrated software for efficient data acquisition, analysis, and reporting. Specialized software modules allow biologists to rotate and manipulate 3D reconstructions of a sample, providing valuable insights into its internal structure. XL30 is a user-friendly system, making it easy to set up, operate, and maintain. Its intuitive user interface ensures changes can quickly be made and new imaging settings can be quickly incorporated. Furthermore, this unit is compatible with a variety of peripherals such as detectors, cameras, and adapters, providing greater flexibility for customizing the machine to suit special applications. Overall, FEI XL30 is a versatile scanning electron microscope which offers superior imaging resolution, accurate elemental analysis capabilities, and critical 3D imaging for material characterization. Its combination of advanced features, reliability, and user-friendliness makes it a powerful tool for research and industrial applications.