Used PHILIPS / FEI XL 30 #9203026 for sale

PHILIPS / FEI XL 30 is a scanning electron microscope (SEM) designed for high resolution imaging and analysis of samples. It is equipped with an in-lens secondary electron (SE) detector and a field emission (FE) source. The in-lens detector gives the microscope the ability to acquire topographic images with a large depth of field and to produce superior images across the entire field of view. The field emission source, powered by xenon gas, offers high brightness, low energy spread, and precise settings. The combination of the in-lens and field emission makes FEI XL 30 an excellent tool for research purposes. The microscope is equipped with a unique in-lens detector that can operate at three different magnifications: 10, 30, and 60x. This high-sensitivity detector has low noise level characteristics and allows for precise SEM image acquisition. The integrated SE signal amplifier also allows the microscope to generate SE images of the sample with both contours and shades of gray. FEI X-MaxSEM detector is equipped with patented X-Tilt Technology that enables 3D imaging and analysis. This combined with the high-sensitivity detector makes PHILIPS XL30 perfect for 3D imaging tasks. It also provides a faster scanning speed due to the SE detector being located at the back focal plane of the objective which results in reduced dead time. PHILIPS XL 30 offers a variety of analytical applications, including Energy Dispersive X-ray Spectroscopy (EDS), electron backscatter diffraction (EBSD), cathodoluminescence (CL), and electron energy loss spectroscopy (EELS). It also offers advanced image processing capabilities such as bright field, dark field and polarization contrast. This is facilitated by a user-friendly graphical user interface that is easy to use and allows users to quickly and accurately obtain the desired images and data. XL 30 is the perfect choice for researchers and engineers who need a superior-quality SEM W laboratory instrument that is reliable, fast and accurate. It provides the perfect combination of excellent performance, user-friendly operation, and a wide range of advanced analytical capabilities. It offers excellent results for virtually any sample analysis or imaging application.