Used PHILIPS / FEI XL 30 #9257598 for sale

PHILIPS / FEI XL 30 scanning electron microscope is an advanced laboratory instrument that allows researchers to study the structures of materials at atomic and nanoscale levels with unprecedented accuracy and detail. The main features of the microscope include a field-emission electron source, high resolution imaging capabilities, automated sample handling and stage positioning, and the ability to perform a wide range of experiments in a variety of materials. The field-emission electron source produces a focused beam of electrons that can be scanned across the sample's surface. This enables the user to produce images of the sample material's structure with a resolution of less than 1 angstrom (0.1 nanometers). It also allows for experiments such as energy-dispersive x-ray analyses (EDX) and energy-filtered imaging (EFI) to be conducted. The microscope's automated sample handling and stage positioning allow for the efficient and error-free positioning of the sample, enabling the user to search for features with precision. In addition to offering high-resolution imaging, FEI XL 30 can also perform wide range of experiments on materials. Experiments such as electron beam induced current (EBIC) and electron backscatter analysis (EBSA) can be conducted to investigate the electrical and optical properties of a material at the atomic level. The microscope also provides the option to incorporate external detectors such as ion and electron-beam mixing detectors that can be used to measure the properties of a material in real time. PHILIPS XL30 scanning electron microscope provides the user with unrivaled accuracy and detail when studying biological and inorganic materials. Its high resolution imaging capabilities, automated sample handling, and the ability to perform a wide range of experiments make it a powerful instrument for any laboratory researching material properties at the nanoscale and atomic levels.