Used PHILIPS / FEI XL 30 #9259822 for sale

PHILIPS / FEI XL 30 is a scanning electron microscope (SEM) which provides a powerful tool for microscopic imaging and analysis of samples at the nanometer level. FEI XL 30 is capable of high-resolution imaging, with a resolution of down to 0.3 nanometers, and simultaneous detection of three imaging modalities: secondary electrons, backscattered electrons, and X-ray spectroscopy. PHILIPS XL30 is a large and versatile instrument, featuring an impressive range of features and capabilities. It provides semi-automation capabilities, with an ergonomic and user-friendly WORKPLACE environment, allowing users to work efficiently and effectively. The system is equipped with the latest Scanning Augmented Pre-aligned (SAP) sample positioning technology, which allows for fast and accurate repeatable position setting. The monochromator built in to FEI XL30 has a 3-pole configuration, which yields an electron beam that is homogeneously illuminated with no visible coma aberrations, ensuring optimal imaging conditions. The Super-resolution Feature allows for enhanced detection of fine structures at the nanometer level. The SEM-EDS detector provided by PHILIPS / FEI XL30 is capable of simultaneous acquisition of information from multiple charged particles, allowing for the detection of elements down to magnesium (9) on the periodic table. It has a completely integrated acquisition and analysis software package, allowing for advanced data handling without external packages. XL30 utilizes both the TrueDepth™ and TrueContrast™ technologies to increase depth of field and provide superior contrast and resolution. The dual filament electron source enables an extended dynamic range and improved stability, while the correction features of the imaging system reduce the time and manual effort when correcting degaussing position or current/voltage settings. In conclusion, PHILIPS XL 30 is a powerful SEM designed to deliver unprecedented imaging capabilities in research and industry. It offers an impressive range of features, technologies and capabilities, with an ergonomic design tailored to the needs of scientists and industrial engineers. With its advanced abilities and extended range of features, XL 30 provides a comprehensive choice of instrumentation for surface analysis and imaging.