Used PHILIPS / FEI XL 30 #9260357 for sale

PHILIPS / FEI XL 30 is a powerful scanning electron microscope (SEM) that combines advanced technology in a compact package. It is designed for use in a wide range of applications and delivers accurate, high-resolution images for optimal visual clarity. This SEM is perfect for research and development purposes in biological, materials, and industrial science. FEI XL 30 is a tabletop SEM and offers a variety of features that make it easy to use, such as a 48 cm (19 in) monitor, intuitive sample orientation software, and a mouse-based control system. It has a maximum resolution of 1.5 nm, a high quantum efficiency of up to 90%, and a large field of view of more than 5 mm. The SEM is perfectly suited for imaging and analysis of biological and biological-based samples. PHILIPS XL30 includes a variety of imaging modes, such as back-scattered electron imaging (BSE), secondary electron imaging (SEI) and scanning transmission electron microscopy (STEM). BSE is a technique that is used to detect surface features such as grain boundaries, phosphor layers and geological textures, while SEI is used to analyze surface morphology and elemental composition of materials. STEM can be used to observe lattice structure and cellular features at the nanometer scale. FEI XL30 also offers advanced imaging capabilities, such as stereomicroscopy, which is used for the detection of sub-cellular objects; electron energy-loss spectroscopy (EELS), which provides a multi-parametric analysis of the atomic and electronic structure of materials; and energy-filtered transmission electron microscopy (EFTEM), which offers a high contrast imaging for biological and biological-based samples. PHILIPS / FEI XL30 also offers spectroscopic analytical capabilities, such as energy dispersive spectrometry (EDS) and electron energy analyzer (EEA), which measure the composition and elemental distribution of the samples with high accuracy. These spectroscopic tools allow for the detection and characterization of elements down to the trace level. XL30 utilizes high vacuum environment and has a specialized cryogenic stage with freeze-fracture capability, which is useful for preparing and imaging samples down to -150°C. In addition, the SEM offers an automated sample changer, allowing for unattended large-scale imaging and X-ray mapping of samples. In conclusion, XL 30 is a feature-packed tabletop scanning electron microscope that offers accurate, high-resolution images for research and development purposes. Its user-friendly design and wide range of imaging and spectroscopic capabilities make it the ideal choice for scientists and engineers.