Used PHILIPS / FEI XL 30 #9276335 for sale

PHILIPS / FEI XL 30 is a scanning electron microscope (SEM) that provides imaging and analytical capabilities necessary for both materials research and life science applications. The SEM uses a focused electron beam to generate images of small structures, allowing for a magnified view of the material surface at a maximum resolution of 0.8 nanometers. The imaging capability of the microscope is greatly enhanced by the high level of electron-optical correction technologies, making it an ideal tool for nano-scale imaging and analysis. FEI XL 30 features features an electron source operated at 200-30KV, with 500-300KV optional, allowing for a maximum sample height of 5 cm and a minimum sample height of 5 nm. This high resolution and long working distance allows for the observation of large irregularly shaped objects without the need for a change in lenses. The microscope also has an in-lens secondary electron detector and a backscattered electron detector to give high contrast between materials with different densities. PHILIPS XL30 is also equipped with a variety of detectors and detectors that allow for a range of experiments and imaging capabilities, some of which include: Energy Dispersive Spectroscopy (EDS) for elemental analysis, Wavelength Dispersive Spectroscopy (WDS) for surface analysis, and Backscattered Electron Detector (BSD) for topographical imaging. A High Resolution Direct Electron Detectors (DED) is also available for crystallographic imaging. The microscope can also be used for secondary electron imaging (SEI), backscattered imaging (BSI), and differential interference contrast imaging (DIC). The visualization capabilities of PHILIPS / FEI XL30 are further enhanced by a suite of data acquisition, imaging and analysis software. This software enables users to acquire images, perform quantitative measurements, and easily access the data for publication or comparison with other SEMs. XL30 is an ideal SEM for a variety of research such as nanotechnology, materials science, geology, environmental science, life science and forensics. Its high sensitivity and resolution make it a unique tool that can be used to examine materials and processes unseen at lower magnifications. It is also an excellent choice for quality control in industry and educational settings.