Used PHILIPS / FEI XL 30 #9280521 for sale

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ID: 9280521
Environmental Scanning Electron Microscope (ESEM) Lab6 Stages: Hot and cold Water chiller ODP Detectors: BSE GSED SED EDX With liquid nitrogen Peletier stage Pump PC and accessories.
PHILIPS / FEI XL 30 is a high-performance scanning electron microscope (SEM) designed for a wide range of applications in nanoscience and nanotechnology. Its small sample chamber, low energy operation, and enhanced imaging capabilities make it particularly well-suited for low voltage, high-resolution imaging of very small samples. FEI XL 30 utilizes an advanced electron source design with an electron column designed for ultra-low electron voltages, making it ideal for obtaining high-resolution images of very small samples. The high optics system provides excellent spot resolution for small features and nanostructures. It also includes a state-of-the-art digital imaging/optical system. A built-in array of fibrolytic optics enables PHILIPS XL30 to image samples at near-atomic resolution in the high pressure and low vacuum range. Additionally, XL 30 is equipped with a wide range of detectors for specialized applications. A retractable back-scattering detector provides clear, contrasty images of topographical and elemental features in the sample. An energy-dispersive X-ray spectrometer (EDS) is available for advanced elemental analysis. In addition, PHILIPS / FEI XL30 includes a field emission detector that can operate at high magnifications in the low vacuum and ultra-low-vacuum range, providing images with sub-Ångström resolution. PHILIPS XL 30 also offers a wide range of automated features, making it simple and fast to operate. An automated mapping feature provides complex power and voltage control to generate a wide range of image contrast. An automated drift suppression system eliminates drift artifacts and provides sharper images. Automated routine operations make sample preparation and analysis easier, helping to maximize productivity and minimize user fatigue. Finally, XL30 is a reliable, full-featured SEM platform. Its modular design and tailored electronics reduce the need for maintenance and repairs. Its low-vacuum operation ensures fewer sample degradation and contamination. Together, these features make FEI XL30 a reliable choice for nanoscale imaging, energy-dispersive X-ray spectroscopy, and other advanced applications.
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