Used PHILIPS / FEI XL 30 #9284171 for sale

PHILIPS / FEI XL 30 is a high-resolution scanning electron microscope (SEM) that uses high voltage electrons to scan surfaces of materials and produce images of its topography, morphology, and elemental composition. This model offers high performance with both high resolution imaging and high speed operations. FEI XL 30 has an impressive flat panel display with high-brown resolution, offering the operator clear images of their specimens. It has the ability to quickly acquire and save images, including those with color overlays that provide detailed contours and images of elemental compositions for analysis. Additionally, the image is directly projected onto the computer screen for maximum versatility. PHILIPS XL30 also offers an impressive range of automated capabilities, from fully automated tilt/lift alignment and sample surface positioning to automated drift correction. It also has a dedicated beam deflector and focusing dial for changing the resolution of images. The integrated robolab equipment allows for the selection of predetermined experiments, allowing for automation of processing and analysis. In terms of its operating capabilities, PHILIPS XL 30 has a wide range of scanning options, from low vacuum to ultra-high resolution in combination systems. It also has a powerful phase-contrast imaging mode, which provides phase contrast and grain contrast as well as focusing, to maximize image detail. Additionally, XL30 has an adjustable beam voltage that can be quickly and precisely adjusted to the users to facilitate better instrument operation. To facilitate maximum performance, PHILIPS / FEI XL30 offers an advanced environmental control unit, which adjusts humidity, temperature, and gas pressure to maximize performance. This model also includes an advanced filter system to reduce the amount of pollutants and debris that reaches the specimen, as well as noise absorption frame floors to reduce vibration. In terms of safety, FEI XL30 has a safety interlock unit for the specimen chamber, designed to shut off the electron beam in the event of motion. There is also an overload current protection machine, which works to protect the surrounding structures and components from an overvoltage. Additionally, XL 30 has a soft impact braking tool which allows for an immediate shutdown of the electron beam, minimizing any potential damage to the specimen.