Used PHILIPS / FEI XL 30 #9396739 for sale

PHILIPS / FEI XL 30 scanning electron microscope (SEM) is a field emission SEM used for imaging and analysis of materials and samples. FEI XL 30 can obtain images of samples with 3-5 nanometer resolution, making it an ideal tool for fundamental research, semiconductor and life science applications. PHILIPS XL30 features a cold field emission electron source, as opposed to a thermionic source, which increases the electron beam coherence, brightness and stability over a wider range of accelerating voltages. This higher source brightness helps to improve the resolution of the instrument by detecting low intensity signals. PHILIPS XL 30 is equipped with a high performance backscatter detector system, which is capable of acquiring previously inaccessible material analysis data. This system enables both conventional and aberration corrected imaging. It also includes two live secondary electron detectors that allow simultaneous imaging of the topography and surface structure. In addition, XL 30 includes advanced image processing and analysis capabilities. The automated image optimization feature helps to achieve optimal image quality, while the auto-centered stage can interface with multiple z-axis stages and manipulators to provide a range of motion. In terms of sample handling, PHILIPS / FEI XL30 is equipped with a wide range of sample holders and stages. These include everything from a high vacuum sample manipulator to a cryo-holder for low temperature imaging. Additionally, FEI XL30 utilizes automated environmental control to provide a range of environmental conditions. Finally, XL30 offers a range of safety features, including an enhanced chamber radiation shield, mechanical vibration isolation and an auto-stage collision avoidance system. Overall, PHILIPS / FEI XL 30 is an ideal platform for electron microscopy, with its state-of-the-art features and performance. The combination of advanced imaging capabilities, sample stages and safety features makes FEI XL 30 an ideal instrument for discovery and research.