Used PHILIPS / FEI XL 30 #9398344 for sale

Name: PHILIPS / FEI XL 30
Brand: PHILIPS / FEI
SKU: 9398344
Availability: InStock

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Scanning Electron Microscopes

Manufacturer

PHILIPS / FEI

Model

XL 30

ID: 9398344

Vintage: 1998

Scanning Electron Microscope (SEM) Tungsten Camera options: SE, BSE, CCD, IR EDS SiLi EDAX manual stage: 10 mm Diffusion pump ODP Diffusion stack High vacuum mode conventional Everhart-Thornley detector With variable grid bias Back Scattered Electron Detector (BSED) Turbo molecular pumping system End pressure: < 5.10-4 Pa (< 5.10-6 mBar) EDWARDS Pre-vacuum rotary pump Penning gauge standard ThermoFlex recirculating water chiller Electron source tungsten gun Voltage: 500 V to 30 kV Maximum beam current: >1 to µA Resolution: 3.5 nm at 30 kV Focus range: 3 mm to 99 mm Range: 20x to > 500,000x Manual stages: X - Y: 50 mm Z: 25 mm x 25 mm Tilt range: 75°C to 15°C (Manual) Rotation: n x 3600 Eucentric tilt at AWD: 10 mm Single stub holder Operating system: Microsoft Windows NT 1998 vintage.

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PHILIPS / FEI XL 30 is a high performance scanning electron microscope (SEM) designed for precise imaging and materials analysis. It is built to handle challenging tasks with high accuracy and speed. The unit is equipped with an advanced electron gun and an adjustable lens equipment that provides superior performance and resolution in a wide range of applications. FEI XL 30 is designed to accurately focus and detect electrons over a large imaging area. The high quality imaging capability is further enhanced by the system's ability to switch between multiple electron sources ranging from low to high power. The main lens unit is supported by a high-resolution secondary lens machine for the inclusion of small features. The unit includes high-end detectors for measuring features down to a single micrometer or less. With both a high-performance phosphorescent and secondary electron detector, the unit can provide detailed images of materials from the sub-micron range to the macro level. Additionally, a range of detectors and spectroscopic tools can be used for SEM-EDX, STEM-EDX and EDS analyses. PHILIPS XL30 is equipped with precision automated specimen stages to ensure consistent and rapid movement of the sample. The stage is designed to be easily adjusted, enabling the collection of data over extended periods of time. As the stage is XY driven and tilted, various specimen orientations can be achieved with ease. Magnification of the sample can also be adjusted by adjusting the automatically adjustable lower source-to-sample clearance. PHILIPS XL 30 supports several operational modes to enable the user to study a variety of materials and structures. Among these are Secondary Electron Imaging (SEI), Backscattered Electron Imaging (BEI), Electron Backscatter Diffraction (EBSD) and Cathodoluminescence (CL). With the added feature of EDS, the unit is capable of performing compositional analysis and mapping at the sub-micron level. In summary, PHILIPS / FEI XL30 is a versatile and powerful SEM designed to provide accurate imaging, materials analysis and compositional mapping. The unit is equipped with advanced electron sources and detectors, multiple analytical tools and automated specimen stages to ensure easier and more productive results.