Used PHILIPS / FEI XL 30 #9408620 for sale

PHILIPS / FEI XL 30 is a scanning electron microscope (SEM) that includes a large field of view, fast scan speed, and high resolution imaging capabilities. FEI XL 30 was designed for both research and industrial applications. Its advanced electron optics and new imaging technologies enable it to produce significantly improved raw data quality. The microscope's large field of view offers an unprecedented level of detail not available in standard SEMs. For example, it can easily produce cross sections of objects that have never been seen before at a fraction of the cost compared to manual cross-sectioning. It is also capable of rapid scanning, with scan speeds higher than any other SEM in its class. The imaging capabilities of PHILIPS XL30 are enhanced by its cutting-edge electron optics. A modified germanium Wien filter ensures excellent image resolution even at low beam energy. This results in impressive depth of field and exceptional depth of focus. Degree of vacuum stabilization is also provided by a patented secondary electron suppressor (SES) that can instantly adjust to new vacuum conditions during use. In addition, XL 30 has been designed to be easy to use. Its user interface includes helpful hints and tips for new users as well as automated image processing capabilities. Electric field mapping, automatic edge detection and surface topography measurements are also provided for enhanced sample analysis. In summary, PHILIPS / FEI XL30 is a powerful and versatile SEM that offers unparalleled performance in image resolution, speed, and field of view. Its advanced optics, intuitive user interface and automated features allow it to become an ideal tool for research and industrial applications.