Used PHILIPS / FEI XL 30S #293674765 for sale

PHILIPS / FEI XL 30S is a versatile scanning electron microscope (SEM) with a unique combination of high performance, capabilities and cost efficiency. Its wide range of capabilities and user-friendly design make it a popular choice for use in industry, academia, and research. This advanced SEM equipment is built for an optimized imaging and crystal orientation experience. It is configured with a 4-axis optical system that provides up to 18 kV beam magnification and 10 nm resolution capabilities. The unit features a high-pressure automated carbon sample loading machine for fast and reliable loading of specimen materials. Other impressive features of FEI XL30S include an auto-alignment tool for sample stages, a built-in Brucker/Sargent sample changer, and a low-vacuum sample holder for analysis of low-kV specimens. The specimen sample holder has a large working area and is designed to maximize throughput. PHILIPS XL 30 S is designed to operate in the low-kV environment with a high image resolution of up to 12 nm at 10 kV. This is achieved through the use of high-intensity, digital image processing algorithms and high dynamic range contrast. It also features a high performance, low vibration motorized stage with a low stiffness structure. The advanced FEI XL 30S asset is equipped with an E-Z data acquisition software and E-Z analytical software for enhanced image analysis and reporting experiences. The E-Z data acquisition suite includes software for image processing, microstructural analysis, texture measurement, and elemental composition determination. The model is designed for a wide range of applications. Its versatility and ease of use make it suitable for imaging and crystal orientation studies in diverse markets, including industrial materials, semiconductor substrates, coatings, and metallurgy. Overall, XL30S is an ideal choice for laboratories and research facilities looking for advanced high-performance SEM capabilities. Its high resolution imaging with fast throughput makes it an ideal choice for quick analysis and more detailed analysis of specimens.