Used PHILIPS / FEI XL 40 #293610598 for sale

PHILIPS / FEI XL 40 is an advanced scanning electron microscope (SEM) designed to provide users with powerful and reliable scanning capabilities. This state-of-the-art microscope is capable of providing magnifications of up to 25,000x with a resolution of over 1nm. It also offers a large field of view and provides users with real-time observation of processes that occur in nanometer-sized specimens. FEI XL 40 is equipped with a field emission gun that allows for a low beam current and a high current density which makes for greater accuracy and resolution. This SEM also features an in-columnPrimary and Secondary Electron Detector (PE/SEC) allowing users to rapidly switch between data collecting and imaging modes, which improves efficiency. Additionally, PHILIPS XL-40 includes a backscatter detector allowing users to identify different materials in a sample, as well as an Energy Dispersive X-ray Detector (EDS) for elemental analysis. PHILIPS / FEI XL-40 also features a high-quality flat panel monitor and six-axis motorization, providing users with automated sample scanning. PHILIPS XL 40 is designed to be compatible with Aberration Corrected EMs, allowing users to observe and photograph specimens with improved resolution and definition. This system is also equipped with Stage Autofocus, which allows images to remain focused while the stage is rotated across multiple axes. XL-40 is an advanced SEM designed to provide users with maximum scanning capabilities and resolution. Its advanced features such as Aberration Correction, EDX, high-resolution imaging and sample scanning make it an ideal choice for research, manufacturing and academic applications.