Used PHILIPS / FEI XL 40 #293627438 for sale

PHILIPS / FEI XL 40 is a second-generation Scanning Electron Microscope (SEM) that is designed for a variety of applications. It offers a range of high resolution imaging capabilities, and can be used to visualize samples on an atomic level. The SEM consists of several key components, and is capable of achieving magnifications of up to 400,000x. At the heart of FEI XL 40 is its electron gun. The gun generates a beam of electrons, which are accelerated towards the sample, and upon reaching the sample, interactions between the beam and the sample generate signals. This process is known as secondary electron emission, and results in a grayscale image that reveals features of the sample with a resolution of up to 1 nanometer. PHILIPS XL-40 also incorporates a high-resolution in-column chromatic and spherical aberration corrector. This corrector allows for simultaneous imaging and analysis of the sample from different angles, and reduces undesired aberrations that can lead to incorrect image interpretation. PHILIPS XL 40 is equipped with an AutoTune technology, which is unique to FEI. This technology allows the SEM to be easily operated, even by inexperienced technicians. This technology makes user-controlled, multi-point optimization possible, allowing for faster analysis and improved imaging performance. FEI XL-40 incorporates a range of other features, including a scanning spot size of 10nm, 10nm spectral range of EDS, and low kV cooling. These features allow the SEM to collect the maximum amount of useful data from the sample. To assist the user in interpreting the data, PHILIPS / FEI XL-40 is equipped with a range of analytical techniques, including EDS (energy dispersive spectroscopy) and WDS (wavelength dispersive spectroscopy). With these techniques, a detailed elemental analysis of the sample can be performed. Overall, XL 40 is an excellent SEM for a wide range of applications. Its automated capabilities, high resolution imaging capabilities, and range of analytical techniques enable it to generate detailed information about samples at the atomic level.