Used PHILIPS / FEI XL 40 #293650284 for sale

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ID: 293650284
Vintage: 2001
Emission Scanning Electron Microscope (ESEM) 2001 vintage.
PHILIPS / FEI XL 40 is a state-of-the-art scanning electron microscope designed for superior performance in imaging, microanalysis, and nanometrology. This high-resolution imaging system is engineered to provide reliable, accurate, and rapid 3-D imaging of both biological and non-biological specimens of up to 5 cm in size. FEI XL 40 comes equipped with a multi-detector design that includes both a high magnification secondary electron detector (SE2) and a backscattered electron detector (BSE2) for structural and chemical analysis of materials. It is also compatible with several other specially designed components that allow for more specialized functionality such as sample analysis, automated drift correction, and low voltage imaging. PHILIPS XL-40 scan speed is up to 20,000° per second and uses a unique scan mode that combines two- dimensional (2D) with three-dimensional (3D) imaging. It is rapidly making the transition from the traditional scanning electron microscope to a more efficient, cost-effective imaging system that uses fewer resources and requires less maintenance. Furthermore, FEI XL-40 is equipped with a multi-aperture collector for fine focus scanning and image enhancement. This feature allows for the highest resolution images to be obtained with very low electron dose. The large 20 mm field of view also provides more flexibility when viewing and imaging larger specimens. XL-40 also includes a high throughput gun to reduce particle scattering and reduce dead time while imaging. This allows for faster imaging and data acquisition times, which make the system ideal for quick, high-resolution imaging operations. PHILIPS XL 40 is a powerful imaging tool that provides unprecedented accuracy and resolution for true 3D imaging. It is rapidly becoming the tool of choice for many researchers in biological and physical sciences who are looking for quick, accurate images. With its high-resolution images and its ability to produce detailed scanning electron micrographs, XL 40 provides the perfect imaging platform for high end research and production operations.
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