Used PHILIPS / FEI XL 40 #293650347 for sale

PHILIPS / FEI XL 40 is a scanning electron microscope (SEM) that is used for detailed analysis of a range of materials. It features a variable pressure mode that allows the user to control the pressure in the chamber which is important for the imaging of fragile samples such as biological matter. The combination of field-emission source and special Everhart-Thornley gas detector allows the microscope to operate under various conditions and to deliver extremely high resolution images thanks to a large depth of focus. The special feature of this microscope is its ability to work in three-dimensional mode allowing users to build and manipulate highly detailed 3D reconstructions of components and nanostructures. The microscope is equipped with an integrated high power EDS (Energy Dispersive X-ray Spectrometry) detector that allows for simultaneous elemental analysis of samples. The EDS detector is further integrated with a fast automated sample loading system for convenience in obtaining a full mapping of components. The combination of these features yields a multifaceted spectrum of analytical capabilities that allow for a good understanding of the sample's composition. FEI XL 40 also features an in-lens detector that allows for better contrast and resolution for imaging. The in-lens detector uses a unique low kV platform which modulates the electrical charge of the electron beam in order to increase the contrast in the images and improve the resolution. This feature combined with an in-lens autoscan system makes this microscope great for capturing the highest level of details in a wide range of materials. Built on an open platform that is easily upgradable, PHILIPS XL-40 is designed to accommodate the most demanding of requirements. It is designed to be ergonomic and can be quickly and easy assembled and operated with minimal training. When it comes to monitoring, PHILIPS / FEI XL-40 is equipped with an intuitive user interface that allows for simple, feature-rich operability. In summary, FEI XL-40 is a powerful and reliable scanning electron microscope that is specifically designed for detailed analysis of a variety of materials. It is capable of providing extremely high-resolution imaging and simultaneous elemental analysis thanks to its innovative technological features. It is also highly controllable and intuitively operable, making it an ideal choice for a variety of users.